Published May 1, 2016 | Version v1
Journal article

Performance analysis of charge plasma based dual electrode tunnel FET

  • 1. Department of Electronics and Communication Engineering, Dr. B. R. Ambedkar National Institute of Technology Jalandhar, Jalandhar, 144011 (India)

Description

This paper proposes the charge plasma based dual electrode doping-less tunnel FET (DEDLTFET). The paper compares the device performance of the conventional doping-less TFET (DLTFET) and doped TFET (DGTFET). DEDLTEFT gives the superior results with high ON state current ( I ON ∼ 0.56 mA/μm), I ON/ I OFF ratio ∼ 9.12 × 1013 and an average subthreshold swing (AV-SS ∼ 48 mV/dec). The variation of different device parameters such as channel length, gate oxide material, gate oxide thickness, silicon thickness, gate work function and temperature variation are done and compared with DLTFET and DGTFET. Through the extensive analysis it is found that DEDLTFET shows the better performance than the other two devices, which gives the indication for an excellent future in low power applications. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1674-4926/37/5/054003

Additional details

Publishing Information

Journal Title
Journal of Semiconductors
Journal Volume
37
Journal Issue
5
Journal Page Range
[8 p.]
ISSN
1674-4926