Performance analysis of charge plasma based dual electrode tunnel FET
Creators
- 1. Department of Electronics and Communication Engineering, Dr. B. R. Ambedkar National Institute of Technology Jalandhar, Jalandhar, 144011 (India)
Description
This paper proposes the charge plasma based dual electrode doping-less tunnel FET (DEDLTFET). The paper compares the device performance of the conventional doping-less TFET (DLTFET) and doped TFET (DGTFET). DEDLTEFT gives the superior results with high ON state current ( I ON ∼ 0.56 mA/μm), I ON/ I OFF ratio ∼ 9.12 × 1013 and an average subthreshold swing (AV-SS ∼ 48 mV/dec). The variation of different device parameters such as channel length, gate oxide material, gate oxide thickness, silicon thickness, gate work function and temperature variation are done and compared with DLTFET and DGTFET. Through the extensive analysis it is found that DEDLTFET shows the better performance than the other two devices, which gives the indication for an excellent future in low power applications. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1674-4926/37/5/054003Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Semiconductors
- Journal Volume
- 37
- Journal Issue
- 5
- Journal Page Range
- [8 p.]
- ISSN
- 1674-4926
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49094804
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- COMPARATIVE EVALUATIONS; DOPED MATERIALS; ELECTRODES; EQUIPMENT; FIELD EFFECT TRANSISTORS; OXIDES; PERFORMANCE; PLASMA; SILICON; THICKNESS; TUNNEL EFFECT; WORK FUNCTIONS
- Descriptors DEC
- CHALCOGENIDES; DIMENSIONS; ELEMENTS; EVALUATION; FUNCTIONS; MATERIALS; OXYGEN COMPOUNDS; SEMICONDUCTOR DEVICES; SEMIMETALS; TRANSISTORS