Published March 2007 | Version v1
Report Restricted

Improvements of the detection efficiency of a soft-x-ray emission spectrometer for analytical transmission electron microscopes

Creators

  • 1. Tohoku Univ., Institute of Multidisciplinary Research for Advanced Materials, Sendai, Miyagi (Japan)
  • 2. Japan Atomic Energy Agency, Quantum Beam Science Directorate, Kizu, Kyoto (Japan)

Description

In this development, a Ni-coated varied-line spaced grating (VLS) with an averaged groove density of 1600 l/mm was fabricated. The optics of the grating was designed for a soft-X-ray emission spectrometer for a transmission electron microscope (SXES-TEM). The grating covers an energy range from 165 eV (7.5 nm) to 500 eV (2.5 nm). The performance of the grating was evaluated by using a SOR facility. It was revealed that the efficiency of the grating is 2-3 times larger than that of an Au-coated one. The grating was installed to the SXES-TEM instrument and confirmed the nice performance by measuring C-K emission line of diamond. (author)

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Part of:
Proceedings of the joint meeting of ultrafast pulse high intensity laser research collaboration and JAEA-KPSI 7th symposium on advanced photon research

Additional details

Publishing Information

Imprint Title
Proceedings of the joint meeting of ultrafast pulse high intensity laser research collaboration and JAEA-KPSI 7th symposium on advanced photon research
Imprint Pagination
259 p.
Journal Page Range
p. 167-170
Report number
JAEA-Conf--2007-001

Conference

Title
Joint meeting of ultrafast pulse high intensity laser research collaboration; 7. JAEA-KPSI symposium on advanced photon research
Dates
10-12 May 2006
Place
Kizu, Kyoto (Japan)

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
38102272
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DETECTION; DIFFRACTION GRATINGS; EFFICIENCY; EV RANGE 100-1000; OPTICAL SYSTEMS; PERFORMANCE TESTING; SOFT X RADIATION; SPATIAL RESOLUTION; SPECTROMETERS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY EMISSION ANALYSIS
Descriptors DEC
CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ENERGY RANGE; EV RANGE; IONIZING RADIATIONS; MEASURING INSTRUMENTS; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; RADIATIONS; RESOLUTION; TESTING; X RADIATION

Optional Information

Notes
3 refs., 4 figs., 1 tab.