Published May 2018 | Version v1
Journal article

Exchange bias mechanism in FM/FM/AF spin valve systems in the presence of random unidirectional anisotropy field at the AF interface: The role played by the interface roughness due to randomness

  • 1. Department of Physics, Dokuz Eylül University, Tr-35160 İzmir (Turkey)

Description

Highlights: • We propose atomistic model calculation results for FM/FM/AF multilayers. • We investigate the hysteresis mechanism and exchange bias behavior. • We consider roughened interface structure due to random unidirectional field. • Different types of rough interfaces lead to different behavior of exchange bias. - Abstract: We propose an atomistic model and present Monte Carlo simulation results regarding the influence of FM/AF interface structure on the hysteresis mechanism and exchange bias behavior for a spin valve type FM/FM/AF magnetic junction. We simulate perfectly flat and roughened interface structures both with uncompensated interfacial AF moments. In order to simulate rough interface effect, we introduce the concept of random exchange anisotropy field induced at the interface, and acting on the interface AF spins. Our results yield that different types of the random field distributions of anisotropy field may lead to different behavior of exchange bias.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physleta.2018.03.009

Additional details

Identifiers

DOI
10.1016/j.physleta.2018.03.009;
PII
S0375960118302524;

Publishing Information

Journal Title
Physics Letters. A
Journal Volume
382
Journal Issue
19
Journal Page Range
p. 1298-1304
ISSN
0375-9601
CODEN
PYLAAG

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
51011561
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
ANISOTROPY; COMPUTERIZED SIMULATION; CONNECTORS; DISTRIBUTION; ELECTRIC CONTACTS; HYSTERESIS; MONTE CARLO METHOD; RANDOMNESS; SPIN
Descriptors DEC
ANGULAR MOMENTUM; CALCULATION METHODS; CONDUCTOR DEVICES; ELECTRICAL EQUIPMENT; EQUIPMENT; PARTICLE PROPERTIES; SIMULATION

Optional Information

Copyright
Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.