Exchange bias mechanism in FM/FM/AF spin valve systems in the presence of random unidirectional anisotropy field at the AF interface: The role played by the interface roughness due to randomness
Description
Highlights: • We propose atomistic model calculation results for FM/FM/AF multilayers. • We investigate the hysteresis mechanism and exchange bias behavior. • We consider roughened interface structure due to random unidirectional field. • Different types of rough interfaces lead to different behavior of exchange bias. - Abstract: We propose an atomistic model and present Monte Carlo simulation results regarding the influence of FM/AF interface structure on the hysteresis mechanism and exchange bias behavior for a spin valve type FM/FM/AF magnetic junction. We simulate perfectly flat and roughened interface structures both with uncompensated interfacial AF moments. In order to simulate rough interface effect, we introduce the concept of random exchange anisotropy field induced at the interface, and acting on the interface AF spins. Our results yield that different types of the random field distributions of anisotropy field may lead to different behavior of exchange bias.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physleta.2018.03.009Additional details
Identifiers
- DOI
- 10.1016/j.physleta.2018.03.009;
- PII
- S0375960118302524;
Publishing Information
- Journal Title
- Physics Letters. A
- Journal Volume
- 382
- Journal Issue
- 19
- Journal Page Range
- p. 1298-1304
- ISSN
- 0375-9601
- CODEN
- PYLAAG
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 51011561
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ANISOTROPY; COMPUTERIZED SIMULATION; CONNECTORS; DISTRIBUTION; ELECTRIC CONTACTS; HYSTERESIS; MONTE CARLO METHOD; RANDOMNESS; SPIN
- Descriptors DEC
- ANGULAR MOMENTUM; CALCULATION METHODS; CONDUCTOR DEVICES; ELECTRICAL EQUIPMENT; EQUIPMENT; PARTICLE PROPERTIES; SIMULATION
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.