Published April 2002 | Version v1
Journal article

Microanalysis of ceramics with PIXE and LA-ICP-MS

Description

The provenance postulate states that artifact raw material sources can be determined by chemical characterization as long as between-source chemical differences exceed within-source variation. For ceramics, successful differentiation of sources usually requires the measurement of a large suite of elements. While laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) can provide concentration data for nearly every element whose concentration is at or above 100 ng/g, it requires the use of 'matrix matched' standards for quantitative analysis. In this work, we report on the use of micro-PIXE to develop standards for the microanalysis of ceramics by LA-ICP-MS

Additional details

Identifiers

PII
S0168583X0101093X;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
189
Journal Issue
1-4
Journal Page Range
p. 378-381
ISSN
0168-583X
CODEN
NIMBEU

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
33059365
Subject category
S36: MATERIALS SCIENCE; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
CERAMICS; ICP MASS SPECTROSCOPY; ISOTOPE RATIO; MICROANALYSIS; PIXE ANALYSIS
Descriptors DEC
CHEMICAL ANALYSIS; MASS SPECTROSCOPY; NONDESTRUCTIVE ANALYSIS; SPECTROSCOPY; X-RAY EMISSION ANALYSIS

Optional Information

Copyright
Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.