Published April 2002
| Version v1
Journal article
Microanalysis of ceramics with PIXE and LA-ICP-MS
Creators
Description
The provenance postulate states that artifact raw material sources can be determined by chemical characterization as long as between-source chemical differences exceed within-source variation. For ceramics, successful differentiation of sources usually requires the measurement of a large suite of elements. While laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) can provide concentration data for nearly every element whose concentration is at or above 100 ng/g, it requires the use of 'matrix matched' standards for quantitative analysis. In this work, we report on the use of micro-PIXE to develop standards for the microanalysis of ceramics by LA-ICP-MS
Additional details
Identifiers
- PII
- S0168583X0101093X;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 189
- Journal Issue
- 1-4
- Journal Page Range
- p. 378-381
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 33059365
- Subject category
- S36: MATERIALS SCIENCE; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CERAMICS; ICP MASS SPECTROSCOPY; ISOTOPE RATIO; MICROANALYSIS; PIXE ANALYSIS
- Descriptors DEC
- CHEMICAL ANALYSIS; MASS SPECTROSCOPY; NONDESTRUCTIVE ANALYSIS; SPECTROSCOPY; X-RAY EMISSION ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.