Published June 1973
| Version v1
Journal article
Calculation of system reliability by pattern recognition
Creators
Description
no abstract available
Additional details
Publishing Information
- Journal Title
- Trans. Amer. Nucl. Soc.
- Journal Volume
- 16
- Series
- Trans. Amer. Nucl. Soc.
- Journal Page Range
- 141-142
Conference
- Title
- 19. annual meeting of the American Nuclear Society.
- Dates
- 10 Jun 1973.
- Place
- Chicago, Illinois, USA.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 4089291
- Subject category
- S22: GENERAL STUDIES OF NUCLEAR REACTORS;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- COMPUTER CODES; FAILURES; FAULT TREE ANALYSIS; PROBABILITY; REACTOR COMPONENTS; RELIABILITY
Optional Information
- Notes
- See CONF-730611-- Published in summary form only.