Published January 21, 2016
| Version v1
Journal article
Analysis of transverse RMS emittance growth of a beam induced by spherical and chromatic aberration in a solenoidal field
- 1. Accelerator and Pulse Power Division, Bhabha Atomic Research Centre, Trombay, Mumbai 400085 (India)
- 2. Homi Bhabha National Institute, Training School Complex, Anushakti Nagar, Mumbai 400094 (India)
Description
In a medium energy beam transport line transverse rms emittance growth associated with spherical aberration is analysed. An analytical expression is derived for beam optics in a solenoid field considering terms up to the third order in the radial displacement. Two important phenomena: effect of spherical aberrations in axial-symmetric focusing lens and influence of nonlinear space charge forces on beam emittance growth are discussed for different beam distributions. In the second part nonlinear effect associated with chromatic aberration that describes the growth of emittance and distortion of phase space area is discussed.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2015.10.074Additional details
Identifiers
- DOI
- 10.1016/j.nima.2015.10.074;
- PII
- S0168-9002(15)01308-X;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 807
- Journal Page Range
- p. 94-100
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48005909
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BEAM EMITTANCE; BEAM OPTICS; BEAM TRANSPORT; BEAMS; CHROMATIC ABERRATIONS; DISTRIBUTION; GEOMETRICAL ABERRATIONS; NONLINEAR PROBLEMS; PHASE SPACE; SOLENOIDS; SPACE CHARGE; SPHERICAL CONFIGURATION; SYMMETRY
- Descriptors DEC
- CONFIGURATION; ELECTRIC COILS; ELECTRICAL EQUIPMENT; EQUIPMENT; MATHEMATICAL SPACE; SPACE
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.