Interfactant-mediated quasi-Frank-van der Merwe growth of Pb on Si(111)
Creators
- 1. Physikalisches Institut, Technische Universitaet Clausthal, 38678 Clausthal-Zellerfeld (Germany)
Description
The influence of interfactants (Au, Ag) on the growth of Pb on Si(111) is studied by low-energy electron microscopy in the temperature range from 260 K to 460 K. On the Si(111)-(7x7) surface Pb grows in the Stranski-Krastanov mode, on the Si(111)-(√(3)x√(3))R30 deg. -Au and on the Si(111)-(6x6)-Au surface in the quasi-Frank-van der Merwe (layer-by-layer) mode. On the Si(111)-(√(3)x√(3))R30 deg. -Ag surface the growth mode changes from layer-by-layer below 300 K to the Stranski-Krastanov mode above 300 K. The temperature dependence of the growth cannot be explained by thermodynamics but is governed by kinetics. The analysis of the maximum island density in terms of the atomistic nucleation theory gives acceptable values for nucleus size and energies only in the layer-by-layer growth regime. In the Stranski-Krastanov growth regime abnormal values are obtained that are attributed to high cluster mobility on the initial two-dimensional layer. The conditions leading to quasi-Frank-van der Merwe growth are discussed
Additional details
Identifiers
- PII
- S0163-1829(00)00647-0;
Publishing Information
- Journal Title
- Physical Review. B, Condensed Matter and Materials Physics
- Journal Volume
- 62
- Journal Issue
- 23
- Journal Page Range
- p. 15815-15825
- ISSN
- 1098-0121
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35075775
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CRYSTAL GROWTH; ELECTRON MICROSCOPY; EPITAXY; GOLD; KINETICS; LAYERS; LEAD; NUCLEATION; SEMICONDUCTOR MATERIALS; SILVER; SURFACES; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K; THIN FILMS
- Descriptors DEC
- CRYSTAL GROWTH METHODS; ELEMENTS; FILMS; MATERIALS; METALS; MICROSCOPY; TEMPERATURE RANGE; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2000 The American Physical Society