The effect of rare earth Nd3+doping on physical characteristics of Cu2O thin films derived by electrodeposition technique
Creators
- 1. Physics Department, M.I.E.T Engineering College, Trichy (India)
- 2. PG and Research Department of Physics, Periyer E.V.R College, Trichy (India)
- 3. Department of physics, Loyola College, Mettala, Namakkal 636 202 (India)
- 4. PG and Research Department of Physics, Arul Anandar College, Karumathur, Madurai (India)
- 5. Millimeter-Wave Innovation Technology Research Centre (MINT), Dongguk University-Seoul, Seoul 04620 (Korea, Republic of)
- 6. Advanced Functional Materials & Optoelectronics Laboratory (AFMOL), Department of Physics, Faculty of Science, King Khalid University, Abha 61413 (Saudi Arabia)
Description
Highlights: • Fabrication of neodymium-doped copper oxide (Cu2O) thin films by electrodeposition was done. • Structural, vibrational and elemental mappings confirm single phase of Cu2O films. • Photoluminescence emission quenching associated to Nd doping was observed in Cu2O films. • Band gap reduction from 2.04 to 1.89 eV with Nd doping in Cu2O was observed. • Photoresponse of films is enhanced with increasing Nd doping and illumination intensity. -- Abstract: Undoped and rare earth Neodymium (Nd) doped cuprous oxide (Cu2O) thin films were prepared by electrodeposition method. The prepared film's structural, morphological, optical and photosensitive properties were analyzed by X-ray diffraction, scanning electron microscopy, energy dispersive X-ray spectroscopy, ultra violet-visible and I-V measurements. The fabricated Cu2O:Nd films exhibited polycrystalline nature with cubic crystal system, and favorably grown along (111) orientation. Crystallite size was decreased from 56 nm to 30 nm with Nd concentrations. Raman spectrum confirmed the Cu2O phase of the prepared films. The morphological analysis showed pyramidal shaped particles for the undoped Cu2O thin film. The energy gap was reduced from 2.04 eV to 1.89 eV as Nd doping level was increased. From photoluminescence spectrum a high intense peak was observed at 619 nm which confirms the optical quality of Cu2O phase. The dielectric constant was increased by increasing the Nd doping concentration from 0 to 5%. In photosensitivity analysis an increase of photo response with respect to illuminated current was observed.
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2019.05.008;
- PII
- S0040609019302743;
Publishing Information
- Journal Title
- Thin Solid Films (Print)
- Journal Volume
- 683
- Journal Page Range
- p. 82-89
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55040987
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- COPPER OXIDES; DIELECTRIC MATERIALS; DOPED MATERIALS; ELECTRODEPOSITION; ENERGY GAP; ILLUMINANCE; MAPPING; NEODYMIUM; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; PHOTOSENSITIVITY; POLYCRYSTALS; RAMAN SPECTRA; SCANNING ELECTRON MICROSCOPY; THIN FILMS; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; COPPER COMPOUNDS; CRYSTALS; DEPOSITION; DIFFRACTION; ELECTROLYSIS; ELECTRON MICROSCOPY; ELEMENTS; EMISSION; FILMS; LUMINESCENCE; LYSIS; MATERIALS; METALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHOTON EMISSION; PHYSICAL PROPERTIES; RARE EARTHS; SCATTERING; SENSITIVITY; SPECTRA; SPECTROSCOPY; SURFACE COATING; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2019 Elsevier B.V. All rights reserved.