Development of structure analysis technique under low temperature and high pressure using radiation beam

This study aims to trially produce a system to measure precisely crystal structure of samples pressured by diamond anvil changeable continuously with temperature and pressure at a range of 10 K and 30 Gpa using radiation beam for x-ray source and imaging plate of two dimensional detector, and to investigate behavior change of various substances under low temperature with the pressure. Using newly installed x-ray CCD camera, it was found that good quality data could be obtained even under a measuring time less than 1 min. As a result, time-sharing measurement and rapid measurement under high temperature/high pressure and under low temperature/high pressure became possible to execute. As required an accurate and rapid process for one dimensionalization to make the x-ray CCD camera to function actually as a detector for DAC + radiation beam experiment, a software analysis on strain and sensitivity compensations is also promoted at PF and preparation of optimum data collection program for high pressure experiment is investigated as a part of its analysis. (G.K.)