Report on the progress of various ongoing projects on out JEOL 3000f 300 kV FEG TEM

Full text: The Electron Microscope Unit (EMU) at the University of Sydney has recently installed a new JEOL 3000F Field Emission Gun TEM. With a point resolution of 1.95 Angstroms, it is the ideal tool for high resolution imaging. The microscope also has an Oxford INCA EDS system and GATAN GIF attached, and with an incident probe of diameter ≥0.5nm. As such, it is an excellent tool for microanalysis and in conjunction with a VGSTEM, these facilities are ideal for a large variety of materials microscopy and microanalysis at high resolution. These facilities are also central to the outreach work of the EMU'S Key Centre and add important capability to the Nanostructural Analysis Network Organisation (NANO) the new Australian Major National Research Facility in characterisation. In this poster we will be presenting results from a number of ongoing projects which demonstrate some of the capabilities of both microscopes, including high resolution imaging, phase analysis in Al alloys, compositional gradients in novel glass optical fibres, alternative mechanisms for the formation of misfit dislocation in quantum dots and compositional analysis in quantum well structures. Copyright (2002) Australian Society for Electron Microscopy Inc