Modifications induced by Li+3, Ni+9 and Au+9 ion beams to CR-39 polymer track detector
Creators
- 1. Department of Physics, HNB Garhwal University, Badshahi Thaul Campus, Tehri Garhwal 249 199 (India)
- 2. Inter University Accelerator Center, Aruna Asaf Ali Marg, New Delhi 110 067 (India)
Description
In the present study, CR-39 polymer of thickness 100 μm is irradiated with swift heavy ions of Li+3 (45 MeV), Ni+9 (120 MeV) and Au+9 (120 MeV) with ion fluence ranging from 1010 ion/cm2 to 1012 ion/cm2. The effects of swift heavy ions on the structural, optical and surface properties of CR-39 are determined. The structural and surface properties are investigated using X-Ray diffraction (XRD) and Scanning Electron Microscopy (SEM), whereas the optical studies are carried out employing UV-vis spectroscopy. UV-vis spectroscopy shows that the band gap of the polymer decreases with ion fluence. The decrease in band gap is more significant in the case of Au beam as compared to Li beam. The FTIR spectrum shows reduction in intensity of typical modes, indicating the degradation of polymer after irradiation. The X-ray diffraction patterns show the amorphous nature of CR-39 polymer. The SEM studies show a systematic change in the surface morphology of the polymers with ion fluence.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.radmeas.2010.07.023Additional details
Identifiers
- DOI
- 10.1016/j.radmeas.2010.07.023;
- PII
- S1350-4487(10)00294-5;
Publishing Information
- Journal Title
- Radiation Measurements
- Journal Volume
- 46
- Journal Issue
- 1
- Journal Page Range
- p. 127-132
- ISSN
- 1350-4487
- CODEN
- RMEAEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42082705
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- DIELECTRIC TRACK DETECTORS; FOURIER TRANSFORMATION; GOLD IONS; HEAVY IONS; INFRARED SPECTRA; ION BEAMS; LITHIUM IONS; NICKEL IONS; SCANNING ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; INTEGRAL TRANSFORMATIONS; IONS; MEASURING INSTRUMENTS; MICROSCOPY; RADIATION DETECTORS; SCATTERING; SPECTRA; TRANSFORMATIONS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.