Published December 1971 | Version v1
Journal article

Capacitance voltage characteristics of neutron-irradiated n+pp+ and p+nn+ junctions

Creators

Description

The small signal capacitance-voltage characteristics of neutron irradiated p+ nn+ and n+ pp+ diodes are described. The capacitance characteristics were measured at frequencies of 1 kHz, 10 kHz, 100 kHz and 1 MHz for five neutron fluences. A qualitative difference in the effect of neutron fluence on the capacitance characteristics of p+ nn+ and n+ pp+ diodes is described. A computer aided device model which is based on an equivalent circuit representation of two deep defect levels is described. The capacitance characteristics of neutron irradiated pR+ nn+ diodes with three different pre-radiation resistivities were computed using the device model representation of two deep acceptor levels. The computed curves are in good agreement with the measured characteristics.

Additional details

Identifiers

Publishing Information

Journal Title
IEEE Transactions on Nuclear Science
Journal Volume
18
Journal Issue
6
Series
IEEE (Inst. Electr. Electron. Eng.) Trans. Nucl. Sci.
Journal Page Range
410-419
ISSN
0018-9499

Conference

Title
Annual conference on nuclear and space radiation effects.
Dates
20 Jul 1971.
Place
Durham, N. H.

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
4041120
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ELECTRIC POTENTIAL; NEUTRONS; PERFORMANCE; RADIATION EFFECTS; SEMICONDUCTOR DIODES; SEMICONDUCTOR JUNCTIONS
Descriptors DEC
BARYONS; ELEMENTARY PARTICLES; FERMIONS; HADRONS; NUCLEONS; SEMICONDUCTOR DEVICES

Optional Information

Notes
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