Published May 1972
| Version v1
Journal article
Low-energy X-ray spectrometry using semiconductors
Creators
- 1. CEA Centre d'Etudes Nucleaires de Saclay, 91 - Gif-sur-Yvette (France). Services d'Electronique
Description
no abstract available
Additional details
Additional titles
- Original title (French)
- Spectrometrie de rayonnements X de faible energie par semiconducteurs
Publishing Information
- Journal Title
- Onde Electr.
- Journal Volume
- 52
- Journal Issue
- 5
- Series
- Onde Electr.
- Journal Page Range
- 228-234
Conference
- Title
- Half-day meeting of the French Society of Electronic and Radioelectric Engineers.
- Dates
- 19 May 1971.
- Place
- Malakoff, France.
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 4039128
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- EFFICIENCY; FIELD EFFECT TRANSISTORS; LI-DRIFTED SI DETECTORS; PREAMPLIFIERS; RESOLUTION; SEMICONDUCTOR DETECTORS; X-RAY SPECTROMETERS
- Descriptors DEC
- AMPLIFIERS; ELECTRONIC EQUIPMENT; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DEVICES; SI SEMICONDUCTOR DETECTORS; SPECTROMETERS; TRANSISTORS
Optional Information
- Notes
- Microfiche of preprint available from INIS Clearinghouse as CEN-CONF--1963.