Line emission tomography for CDX-U using filtered diodes
Creators
- 1. Princeton Plasma Physics Laboratory, Princeton University, Princeton, New Jersey 08543 (United States)
- 2. Johns Hopkins University, Baltimore, Maryland 21218 (United States)
Description
Electron density and temperature in the CDX-U low aspect ratio tokamak are too low to allow observation of fast magnetohydrodynamic activity using soft x-ray continuum emission. However, spectroscopic measurements show that extreme ultraviolet (XUV) line emission of intrinsic impurities is bright enough to observe such activity. In addition, a fast monitoring system for local temperature changes in the plasma core is required for planned auxiliary heating experiments. We present a spectrally resolved tomographic system for fast imaging of OVI 2s endash np, 2p endash nd (n≥3), CV 1s2 endash 1s2p and CVI 1s endash 2p XUV transitions. Using this emission, we can study both core and edge MHD activity, while the CVI to CV intensity ratio can indicate local changes in electron temperature. To achieve maximal throughput together with the needed spectral resolution, we use arrays of surface barrier diodes filtered with bandpass elemental filters. Using M edge filters (Zr, Pd, and Ag), we achieve both good discrimination between the above charge states and large transmission at the wavelengths of interest. Preliminary results obtained from CDX-U are presented. copyright 1997 American Institute of Physics
Additional details
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 68
- Journal Issue
- 1
- Journal Page Range
- p. 1059-1062.
- ISSN
- 0034-6748
- CODEN
- RSINAK
Conference
- Title
- 11. annual high-temperature plasma diagnostics conference.
- Dates
- 12-16 May 1996.
- Place
- Monterey, CA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 28039607
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CARBON IONS; ELECTRON SPECTRA; ELECTRON TEMPERATURE; EMISSION SPECTRA; EXTREME ULTRAVIOLET SPECTRA; IMPURITIES; MAGNETOHYDRODYNAMICS; PALLADIUM; PHOTODIODES; PLASMA DIAGNOSTICS; SILVER; TOKAMAK DEVICES; TOMOGRAPHY; X RADIATION; ZIRCONIUM
- Descriptors DEC
- CHARGED PARTICLES; CLOSED PLASMA DEVICES; ELECTROMAGNETIC RADIATION; ELEMENTS; FLUID MECHANICS; HYDRODYNAMICS; IONIZING RADIATIONS; IONS; MECHANICS; METALS; PLATINUM METALS; RADIATIONS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SPECTRA; THERMONUCLEAR DEVICES; TRANSITION ELEMENTS
Optional Information
- Secondary number(s)
- CONF-960543--.