Published January 1995
| Version v1
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Inter-element effects correction due to the secondary x-ray fluorescence in pixe analysis technic
- 1. Centre de Developpement des Techniques Nucleaires, Lab. des Techniques Nucleaires, Algiers (Algeria)
Description
For accurate determination of analyte concentration, on must take into account the effect of proton energy decrease and as a consequence a change in ionization cross sections as rthe beam penetrates the sample. Further one must also correct for matrix effects. This phenomena is due to the attenuation of the emerging X-rays from a major elements by a minor element which ha sa high coefficient absorption for this radiation. We present in this paper the work related to the developpement of a computer pragram for the estimation of such correction. We show the importance of this correction as function of the proton incident energy and of the sample type and its composition
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Additional details
Additional titles
- Original title (French)
- Correction de l'effet inter-elements engendre par les rayonnements X secondaires dans le cas d'analyse par la technique PIXE
Publishing Information
- Imprint Pagination
- 7 p.
- Report number
- INIS-mf--14518
INIS
- Country of Publication
- Algeria
- Country of Input or Organization
- Algeria
- INIS RN
- 26046023
- Subject category
- S73: NUCLEAR PHYSICS AND RADIATION PHYSICS; S99: GENERAL AND MISCELLANEOUS;
- Descriptors DEI
- CROSS SECTIONS; IONIZATION; NUMERICAL ANALYSIS; PIXE ANALYSIS; RESONANCE ABSORPTION; X RADIATION
- Descriptors DEC
- ABSORPTION; CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MATHEMATICS; NONDESTRUCTIVE ANALYSIS; RADIATIONS; SORPTION; X-RAY EMISSION ANALYSIS