Published May 25, 1993 | Version v1
Patent

Radiation information recording and reading method and device

Description

Radiation rays transmitting object or radiation rays emitted from a material to be tested are irradiated to a radiation information recording medium containing a material which forms a color center by irradiation of radiation rays by coloring the recording medium to record radiation information. Further, a light having a wavelength within a range of the absorption region owned by the color center is irradiated, to read radiation information by optoelectrically detecting the light reflected from the recording medium. Although the reading speed (image forming speed) is limited by a time constant of the light detector, remarkable improvement of image forming speed can be attained compared with a conventional method which utilizes photoluminescence of a photoluminescent material. Further, it can be utilized irrespective of the amount of photoluminescence or photoluminescent response characteristics. In addition, laser beams had to be taken into consideration in the prior art but it is no more necessary to separate the reading laser beams and reflecting lights, thereby enabling to simplify the device. (N.H.)

Availability note (English)

Available from JAPIO. Also available from INPADOC.

Additional details

Publishing Information

Imprint Pagination
15 p.
IPC:
Int. Cl. G21K4/00; G01T1/00; G01T1/04; G03B42/02; H04N1/04.
IPC
Int. Cl. G21K4/00; G01T1/00; G01T1/04; G03B42/02; H04N1/04.
Patent number
JP patent document 5-127000/A/

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
25011104
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Non-conventional Literature
Descriptors DEI
COLOR CENTERS; FLUORESCENCE; IMAGES; IRRADIATION; LASERS; PHOTOELECTRIC EFFECT; PHOTOLUMINESCENCE; RADIATION DETECTORS; TIME DEPENDENCE; WAVELENGTHS
Descriptors DEC
AMPLIFIERS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; EMISSION; EQUIPMENT; LUMINESCENCE; MEASURING INSTRUMENTS; PHOTON EMISSION; POINT DEFECTS; VACANCIES

Optional Information

Secondary number(s)
JP patent application 3-317482.