Characteristics of a single-channel superconducting flux flow transistor fabricated by an AFM modification technique
Creators
- 1. Jeonnam Regional Innovation Agency, 1000 Namak-Ri, Samhyang-Myun, Muan-Gun, Jeollanam-Do 534-700 (Korea, Republic of)
- 2. Mokpo Maritime University, Chukkyo-Dong, Mokpo City, Cheonnam 530-729 (Korea, Republic of)
Description
The demand for high performance, integrity, and miniaturization in the area of electronic and mechanic devices has drawn interest in the fabrication of nanostructures. However, it is difficult to fabricate the channel with nano-scale using a conventional photography techniques. AFM anodization technique is a maskless process and effective method to overcome the difficulty in fabricating a nano-scale channel. In this paper, we first present a new fabrication of a single-channel SFFT using a selective oxidation process induced by an AFM probe. The modified channel was investigated by electron probe microanalyzer (EPMA) to find the compositional variation of the transformed region. In order to confirm the operation of a single-channel SFFT, we measured the voltage-current characteristics at the temperature of liquid nitrogen by an I-V automatic measurement system. Our results indicate that the single-channel SFFT having effect as a weak link is effectively fabricated by an AFM lithography process
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physc.2007.05.026Additional details
Identifiers
- DOI
- 10.1016/j.physc.2007.05.026;
- PII
- S0921-4534(07)00791-5;
Publishing Information
- Journal Title
- Physica. C, Superconductivity
- Journal Volume
- 466
- Journal Issue
- 1-2
- Journal Page Range
- p. 16-22
- ISSN
- 0921-4534
- CODEN
- PHYCE6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39076351
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANODIZATION; CURRENTS; ELECTRIC POTENTIAL; ELECTRON MICROPROBE ANALYSIS; FABRICATION; MINIATURIZATION; MODIFICATIONS; NANOSTRUCTURES; OPERATION; OXIDATION; SUPERCONDUCTING DEVICES; TRANSISTORS
- Descriptors DEC
- CHEMICAL ANALYSIS; CHEMICAL COATING; CHEMICAL REACTIONS; CORROSION PROTECTION; DEPOSITION; ELECTROCHEMICAL COATING; ELECTROLYSIS; LYSIS; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; SEMICONDUCTOR DEVICES; SURFACE COATING
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.