Published March 2008 | Version v1
Report

Production of nanometer sized charged particle beams with glass capillary

  • 1. RIKEN, Atomic Physics Laboratory, Wako, Saitama (Japan)
  • 2. Sophia Univ., Dept. of Physics, Tokyo (Japan)
  • 3. RIKEN, Beam Application Team, Wako, Saitama (Japan)
  • 4. D.V. Skobeltsyn Institute of Nuclear Physics, Moscow State Univ., Moscow (Russian Federation)

Description

We have developed methods to produce nanometer-sized beams of keV highly charged ions and MeV charged particles with various glass-made beam optics. The beam size of 900 nm was obtained for keV ions. (1) For keV energy region, a focusing effect for an Ar8+ beam of 8 keV through a cm-long tapered capillary was obtained with a density enhancement of the transmitted beam compared with that of the input beam, which increases from 1 to 6 as the input current decreases from 30 pA to 0.8 pA. (2) For 4 MeV He2+ beam, a 100 times density enhanced beam by a cm-long tapered capillary with a closed outlet was utilized to irradiate a biological cell in liquid. The range of the beam was controlled by the closed outlet with accuracy of ∼1 μm. Moreover, muon beams with an energy of 13 MeV were also focused with a density enhancement of a factor of ≅2 using 40 cm-long tapered glass tubes. (author)

Part of:
JSPS-CAS core university program seminar. Proceedings of Japan-China joint seminar on atomic and molecular processes in plasma

Additional details

Publishing Information

Imprint Title
JSPS-CAS core university program seminar. Proceedings of Japan-China joint seminar on atomic and molecular processes in plasma
Imprint Pagination
233 p.
Journal Page Range
p. 100-107
Report number
NIFS-PROC--73

Conference

Title
2. Japan-China joint seminar on atomic and molecular processes in plasma
Dates
8-12 Oct 2007
Place
Dunhuang (China)

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
40104445
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAM OPTICS; CAPILLARY FLOW; CHARGED PARTICLES; FOCUSING; GLASS; IRRADIATION; KEV RANGE 01-10; KEV RANGE 10-100; MULTICHARGED IONS; MUON BEAMS; NANOSTRUCTURES; PARTICLE BEAMS; TRANSMISSION
Descriptors DEC
BEAMS; CHARGED PARTICLES; ENERGY RANGE; FLUID FLOW; IONS; KEV RANGE; LEPTON BEAMS; PARTICLE BEAMS

Optional Information

Notes
28 refs., 7 figs.