Production of nanometer sized charged particle beams with glass capillary
Creators
- 1. RIKEN, Atomic Physics Laboratory, Wako, Saitama (Japan)
- 2. Sophia Univ., Dept. of Physics, Tokyo (Japan)
- 3. RIKEN, Beam Application Team, Wako, Saitama (Japan)
- 4. D.V. Skobeltsyn Institute of Nuclear Physics, Moscow State Univ., Moscow (Russian Federation)
Description
We have developed methods to produce nanometer-sized beams of keV highly charged ions and MeV charged particles with various glass-made beam optics. The beam size of 900 nm was obtained for keV ions. (1) For keV energy region, a focusing effect for an Ar8+ beam of 8 keV through a cm-long tapered capillary was obtained with a density enhancement of the transmitted beam compared with that of the input beam, which increases from 1 to 6 as the input current decreases from 30 pA to 0.8 pA. (2) For 4 MeV He2+ beam, a 100 times density enhanced beam by a cm-long tapered capillary with a closed outlet was utilized to irradiate a biological cell in liquid. The range of the beam was controlled by the closed outlet with accuracy of ∼1 μm. Moreover, muon beams with an energy of 13 MeV were also focused with a density enhancement of a factor of ≅2 using 40 cm-long tapered glass tubes. (author)
Additional details
Publishing Information
- Imprint Title
- JSPS-CAS core university program seminar. Proceedings of Japan-China joint seminar on atomic and molecular processes in plasma
- Imprint Pagination
- 233 p.
- Journal Page Range
- p. 100-107
- Report number
- NIFS-PROC--73
Conference
- Title
- 2. Japan-China joint seminar on atomic and molecular processes in plasma
- Dates
- 8-12 Oct 2007
- Place
- Dunhuang (China)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 40104445
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM OPTICS; CAPILLARY FLOW; CHARGED PARTICLES; FOCUSING; GLASS; IRRADIATION; KEV RANGE 01-10; KEV RANGE 10-100; MULTICHARGED IONS; MUON BEAMS; NANOSTRUCTURES; PARTICLE BEAMS; TRANSMISSION
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; ENERGY RANGE; FLUID FLOW; IONS; KEV RANGE; LEPTON BEAMS; PARTICLE BEAMS
Optional Information
- Notes
- 28 refs., 7 figs.