Published 2002 | Version v1
Book

Electronic module for control of sample feeding device of spectrometers of X-ray fluorescent analysis of CRV type

  • 1. TOO 'Dal'tek-U-Ka', Ust'-Kamenogorsk (Kazakhstan)

Description

The scheme of electronic module for sample feeding device control for the CRV type X-ray fluorescence analysis spectrometers is considered. This module provides realization of next functions: sample change operations and installation in starting position; signaling and defense at emergency cases; indication of any sample amount in the spectrometer chamber; testing function at tuning and testing of modules. All these principal functions are entrusted with microcontroller. Programming of the microcontroller is putting into effect by algorithm of the whole sample feeding device. In the capacity of microcontroller the single crystalline processor PICI16C54 and stepping motor of NV-306-V2202 model have been used

Part of:
Proceedings of 7.International conference 'Solid State Physics'

Additional details

Additional titles

Original title (Russian)
Электронный блок управления пробоподающим устройством спектрометров рентгенофлуоресцентного анализа типа SRV

Publishing Information

Publisher
Vostochno-Kazakhstanskij Gosudarstvennyj Tekhnicheskij Univ.
Imprint Place
Ust-Kamenogorsk (Kazakhstan)
ISBN
9965-615-03-9
Imprint Title
Proceedings of 7.International conference 'Solid State Physics'
Imprint Pagination
366 p.
Journal Page Range
p. 321-323

Conference

Title
7.International conference 'Solid State Physics'
Original Conference Title
7.Mezhdunarodnaya konferentsiya 'Fizika Tverdogo Tela'
Dates
4-7 Jun 2002
Place
Ust-Kamenogorsk (Kazakhstan)

INIS

Country of Publication
Kazakhstan
Country of Input or Organization
Kazakhstan
INIS RN
38057981
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CONTROL EQUIPMENT; FEEDING; SAMPLING; X-RAY FLUORESCENCE ANALYSIS; X-RAY FLUORESCENCE ANALYZERS
Descriptors DEC
CHEMICAL ANALYSIS; EQUIPMENT; NONDESTRUCTIVE ANALYSIS; X-RAY EMISSION ANALYSIS

Optional Information

Notes
1 ref. Imprint:Materialy 7.Mezhdunarodnoj konferentsii 'Fizika Tverdogo Tela'