Thermal stability and separation characteristics of anti-sticking layers of Pt/Cr films for the hot slumping technique
Creators
- 1. MOE Key Laboratory of Advanced Micro-Structured Materials, Institute of Precision Optical Engineering, School of Physics Science and Engineering, Tongji University, Shanghai (China)
Description
The thermal stability and separation characteristics of anti-sticking layers of Pt/Cr films are studied in this paper. Several types of adhesion layers were investigated: 10.0 nm Pt, 1.5 nm Cr + 50.0 nm Pt, 2.5 nm Cr + 50.0 nm Pt and 3.5 nm Cr + 50.0 nm Pt fabricated using direct current magnetron sputtering. The variation of layer thickness, roughness, crystallization and surface topography of Pt/Cr films were analyzed by grazing incidence X-ray reflectometry, large angle X-ray diffraction and optical profiler before and after heating. 2.5 nm Cr + 50.0 nm Pt film exhibits the best thermal stability and separation characteristics according to the heating and hot slumping experiments. The film was also applied as an anti-sticking layer to optimize the maximum temperature of the hot slumping technique. (authors)
Additional details
Identifiers
Publishing Information
- Journal Title
- Chinese Physics. C, High Energy Physics and Nuclear Physics
- Journal Volume
- 40
- Journal Issue
- 7
- Journal Page Range
- [7 p.]
- ISSN
- 1674-1137
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 52020283
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CRYSTALLIZATION; DIRECT CURRENT; FILMS; HEATING; LAYERS; MAGNETRONS; SPUTTERING; STABILITY; THICKNESS; X RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CURRENTS; DIFFRACTION; DIMENSIONS; ELECTRIC CURRENTS; ELECTROMAGNETIC RADIATION; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EQUIPMENT; IONIZING RADIATIONS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; PHASE TRANSFORMATIONS; RADIATIONS; SCATTERING
Optional Information
- Notes
- 5 figs., 4 tabs., 25 refs.; http://dx.doi.org/10.1088/1674-1137/40/7/079001