Published July 2016 | Version v1
Journal article

Thermal stability and separation characteristics of anti-sticking layers of Pt/Cr films for the hot slumping technique

  • 1. MOE Key Laboratory of Advanced Micro-Structured Materials, Institute of Precision Optical Engineering, School of Physics Science and Engineering, Tongji University, Shanghai (China)

Description

The thermal stability and separation characteristics of anti-sticking layers of Pt/Cr films are studied in this paper. Several types of adhesion layers were investigated: 10.0 nm Pt, 1.5 nm Cr + 50.0 nm Pt, 2.5 nm Cr + 50.0 nm Pt and 3.5 nm Cr + 50.0 nm Pt fabricated using direct current magnetron sputtering. The variation of layer thickness, roughness, crystallization and surface topography of Pt/Cr films were analyzed by grazing incidence X-ray reflectometry, large angle X-ray diffraction and optical profiler before and after heating. 2.5 nm Cr + 50.0 nm Pt film exhibits the best thermal stability and separation characteristics according to the heating and hot slumping experiments. The film was also applied as an anti-sticking layer to optimize the maximum temperature of the hot slumping technique. (authors)

Additional details

Publishing Information

Journal Title
Chinese Physics. C, High Energy Physics and Nuclear Physics
Journal Volume
40
Journal Issue
7
Journal Page Range
[7 p.]
ISSN
1674-1137

Optional Information

Notes
5 figs., 4 tabs., 25 refs.; http://dx.doi.org/10.1088/1674-1137/40/7/079001