ERC sources for the production of highly charged ions (invited)
Creators
- 1. Lawrence Berkeley Laboratory, Berkeley, California 94720 (USA)
- 2. Michigan State University, East Lansing, Michigan 48824 (USA)
Description
Electron cyclotron resonance ion sources (ECRIS) using rf between 5 and 16 GHz have been developed into stable, reliable sources of highly charged ions produced from a wide range of elements. These devices are currently used as ion sources for cyclotrons, synchrotrons, and heavy-ion linacs for nuclear and relativistic heavy-ion physics. They also serve the atomic physics community as a source of low energy multiply charged ions. In order to improve their performance both with respect to maximum charge state and beam intensity, ECRIS builders are now designing and constructing sources which will operate at frequencies up to 30 GHz. In this article we review the present status of operating ECRIS, review recent experimental measurements on plasma parameters, and look at the technology and potential of sources operating at frequencies up to 30 GHz
Additional details
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 61
- Journal Issue
- 1
- Series
- Rev. Sci. Instrum.
- Journal Page Range
- 221-224
- ISSN
- 0034-6748
- CODEN
- RSINA
Conference
- Title
- International conference on ion sources.
- Dates
- 10-14 Jul 1989.
- Place
- Berkeley, CA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 21058943
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ARGON IONS; CYCLOTRON RESONANCE; ION SOURCES; KRYPTON IONS; MAGNETS; MEASURING METHODS; NEON IONS; NITROGEN IONS; OPERATION; OXYGEN IONS; PERFORMANCE; PLASMA; REVIEWS; RF SYSTEMS; SPECIFICATIONS
- Descriptors DEC
- CHARGED PARTICLES; DOCUMENT TYPES; EQUIPMENT; IONS; RESONANCE
Optional Information
- Secondary number(s)
- CONF-890703--.