Published January 1990 | Version v1
Journal article

ERC sources for the production of highly charged ions (invited)

  • 1. Lawrence Berkeley Laboratory, Berkeley, California 94720 (USA)
  • 2. Michigan State University, East Lansing, Michigan 48824 (USA)

Description

Electron cyclotron resonance ion sources (ECRIS) using rf between 5 and 16 GHz have been developed into stable, reliable sources of highly charged ions produced from a wide range of elements. These devices are currently used as ion sources for cyclotrons, synchrotrons, and heavy-ion linacs for nuclear and relativistic heavy-ion physics. They also serve the atomic physics community as a source of low energy multiply charged ions. In order to improve their performance both with respect to maximum charge state and beam intensity, ECRIS builders are now designing and constructing sources which will operate at frequencies up to 30 GHz. In this article we review the present status of operating ECRIS, review recent experimental measurements on plasma parameters, and look at the technology and potential of sources operating at frequencies up to 30 GHz

Additional details

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
61
Journal Issue
1
Series
Rev. Sci. Instrum.
Journal Page Range
221-224
ISSN
0034-6748
CODEN
RSINA

Conference

Title
International conference on ion sources.
Dates
10-14 Jul 1989.
Place
Berkeley, CA (USA).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
21058943
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ARGON IONS; CYCLOTRON RESONANCE; ION SOURCES; KRYPTON IONS; MAGNETS; MEASURING METHODS; NEON IONS; NITROGEN IONS; OPERATION; OXYGEN IONS; PERFORMANCE; PLASMA; REVIEWS; RF SYSTEMS; SPECIFICATIONS
Descriptors DEC
CHARGED PARTICLES; DOCUMENT TYPES; EQUIPMENT; IONS; RESONANCE

Optional Information

Secondary number(s)
CONF-890703--.