Severe test of a dangling bond only model of thin film silicon p-i-n solar cell degradation

This paper uses a model that links previous research into the metastable defects found in undoped thin film Si:H or a-Si:H (TFS) films to the light-induced degradation of TFS solar cells. The fill factor changes of two experimental studies are modeled. The first series is a group of 704, 4-cm2 p-i-n solar cells with eleven different i-layer thicknesses ranging from 1000A to 200,000A. The second series is a group of 144, 4-cm2 p-i-n solar cells all made in the same deposition and then exposed under different illumination levels and temperatures. The dangling bond model is shown to be an incomplete explanation of the fill factor changes due to light soaking. Data for the short time region and long time region cannot both be fit with the same parameters