Modification of polyethylene terephthalate under high-energy heavy ion irradiation
Description
Polyethylene terephthalate films were irradiated with high-energy heavy ions to fluences ranging from 9x109 to 5.5x1012 ions/cm2. The radiation-induced changes in molecular and crystalline structures were investigated by the Fourier-transform infrared (FTIR) spectroscopy and the X-ray diffraction measurement. FTIR spectra measurements reveal that the material suffers serious degradation through bond breaking. The absorbance of the typical infrared bands decays exponentially with increase of ion fluence and the bond-disruption cross-section shows a sigmoid variation with the electronic energy loss. The semi-crystalline structure of the material is destroyed by the irradiation with processes that are electronic energy loss dependent. At lower electronic energy loss values the amorphization is closely related to the destruction of the trans-configuration of the ethylene glycol residue. At high electronic energy loss, however, other processes determine the amorphization
Additional details
Identifiers
- PII
- S0168583X02006419;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 191
- Journal Issue
- 1-4
- Journal Page Range
- p. 723-727
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34000668
- Subject category
- S36: MATERIALS SCIENCE; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CROSS SECTIONS; CRYSTAL STRUCTURE; ENERGY LOSSES; FOURIER TRANSFORM SPECTROMETERS; HEAVY IONS; INFRARED SPECTROMETERS; ION BEAMS; MOLECULAR STRUCTURE; POLYETHYLENES; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; FILMS; IONS; LOSSES; MEASURING INSTRUMENTS; ORGANIC COMPOUNDS; ORGANIC POLYMERS; POLYMERS; POLYOLEFINS; SCATTERING; SPECTROMETERS
Optional Information
- Copyright
- Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.