Structural transformations in continuously cast Al-Mg alloys
Description
Four continuously cast Al-Mg alloys were cold rolled and annealed by slow heating from room temperature (RT) to 500 deg. C. The influence of solute elements (Mg, Mn, Fe, Si and Cr) on recovery, recrystallization and precipitation was studied by electrical resistivity measurements, light and transmission electron microscopy (TEM) and X-ray analysis. TEM observations proved that deformation recovery occurs during cold rolling and is strongly influenced by the amount of solute atoms, particularly Mg. The most intensive electrical resistivity changes were observed at temperatures above 400 deg. C. TEM examinations indicated that they correspond to precipitation. Solute atoms, namely Mn, Fe, Si and Cr, significantly hinder recrystallization. Precipitation of non-coherent precipitates occurs upon annealing. The presence of Mn, Fe and Si was detected in the fine precipitates by EDAX X-ray analysis
Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2003.10.081;
- PII
- S0925838804001239;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 378
- Journal Issue
- 1-2
- Journal Page Range
- p. 316-321
- ISSN
- 0925-8388
- CODEN
- JALCEU
Conference
- Title
- 9. international symposium on physics of materials
- Acronym
- ISPMA 9
- Dates
- 1-4 Sep 2003
- Place
- Prague (Czech Republic)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37028725
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM ALLOYS; ANNEALING; CASTING; DEFORMATION; DISLOCATIONS; ELECTRIC CONDUCTIVITY; HEATING; MAGNESIUM ALLOYS; PRECIPITATION; RECRYSTALLIZATION; ROLLING; SOLUTES; TEMPERATURE RANGE 0273-0400 K; TRANSMISSION ELECTRON MICROSCOPY; X RADIATION
- Descriptors DEC
- ALLOYS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; FABRICATION; HEAT TREATMENTS; IONIZING RADIATIONS; LINE DEFECTS; MATERIALS WORKING; MICROSCOPY; PHYSICAL PROPERTIES; RADIATIONS; SEPARATION PROCESSES; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.