Published June 2012 | Version v1
Journal article

A new method for charge-loss correction of room-temperature semiconductor detectors using digital trapezoidal pulse shaping

  • 1. Department of Physics, University of Surrey, Guildford GU2 7XH (United Kingdom)

Description

It is well known that semiconductor detectors operating at room temperature can be read out at high rate, with good noise performance and low sensitivity to ballistic deficit, by using trapezoidal (flat-topped) pulse shaping. Nevertheless, the energy resolution of these detectors is also affected by chargetrapping inside the detector crystal, which can not be compensated by the standard trapezoidal pulse shaping. A new digital algorithm based on trapezoidal pulse shaping, to compensate for the charge-trapping effect while minimizing the electronic noise, has been developed. The application of the pulse processing algorithm to a 5 × 5 × 1 mm3 planar Schottky CdTe detector leads to an energy resolution of 1.15% FWHM at 662 keV at room temperature, which is considerably superior to the results of the standard pulse filters.

Availability note (English)

Available from http://dx.doi.org/10.1088/1748-0221/7/06/P06006

Additional details

Publishing Information

Journal Title
Journal of Instrumentation
Journal Volume
7
Journal Issue
06
Journal Page Range
p. P06006
ISSN
1748-0221