Quantitative analysis of absorption and field-induced absorption changes in InGaN/GaN quantum wells
- 1. Palo Alto Research Center Inc., 3333 Coyote Hill Rd., Palo Alto 94304 (United States)
- 2. Institute for Technical Physics I, University of Erlangen, Erwin-Rommel-Str. 1, 91058 Erlangen (Germany)
Description
Results of absorption and electroabsorption measurements are reported for wurtzite InGaN/GaN quantum wells. Despite the relatively high exciton binding energy of 25 meV in GaN no pronounced excitonic features could be observed and the absorption spectra are very similar to those obtained for bulk material. The measured field-induced absorption changes are as large as 7000 cm-1 below and 20000 cm-1 above the band edge. A quantitative analysis of electroabsorption data allows the precise determination of the strong internal fields in InGaN/GaN heterostructures originating from strain-induced polarization and differences in the spontaneous polarization. The fields measured on functioning diodes vary between 1.1 MV cm-1 and 1.4 MV cm-1 for indium concentrations in the InGaN quantum wells ranging from about 7 to 9%. (Abstract Copyright [2002], Wiley Periodicals, Inc.)
Additional details
Identifiers
Publishing Information
- Journal Title
- Physica Status Solidi. B, Basic Research
- Journal Volume
- 234
- Journal Issue
- 3
- Journal Page Range
- p. 742-745
- ISSN
- 0370-1972
- CODEN
- PSSBBD
Conference
- Title
- International workshop on nitride semiconductors
- Acronym
- IWN 2002
- Dates
- 22-25 Jul 2002
- Place
- Aachen (Germany)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 34004479
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION SPECTRA; ELECTRODEPOSITED COATINGS; ENERGY SPECTRA; GALLIUM NITRIDES; HETEROJUNCTIONS; INDIUM NITRIDES; TEMPERATURE RANGE 0273-0400 K; ULTRAVIOLET SPECTRA
- Descriptors DEC
- COATINGS; GALLIUM COMPOUNDS; INDIUM COMPOUNDS; NITRIDES; NITROGEN COMPOUNDS; PNICTIDES; SEMICONDUCTOR JUNCTIONS; SPECTRA; TEMPERATURE RANGE
Optional Information
- Notes
- With 4 figs., 8 refs.. SICI: 0370-1972(200212)234:3<742::AID-PSSB742>3.0.TX;2-I