Published December 1, 2002 | Version v1
Journal article

Quantitative analysis of absorption and field-induced absorption changes in InGaN/GaN quantum wells

  • 1. Palo Alto Research Center Inc., 3333 Coyote Hill Rd., Palo Alto 94304 (United States)
  • 2. Institute for Technical Physics I, University of Erlangen, Erwin-Rommel-Str. 1, 91058 Erlangen (Germany)

Description

Results of absorption and electroabsorption measurements are reported for wurtzite InGaN/GaN quantum wells. Despite the relatively high exciton binding energy of 25 meV in GaN no pronounced excitonic features could be observed and the absorption spectra are very similar to those obtained for bulk material. The measured field-induced absorption changes are as large as 7000 cm-1 below and 20000 cm-1 above the band edge. A quantitative analysis of electroabsorption data allows the precise determination of the strong internal fields in InGaN/GaN heterostructures originating from strain-induced polarization and differences in the spontaneous polarization. The fields measured on functioning diodes vary between 1.1 MV cm-1 and 1.4 MV cm-1 for indium concentrations in the InGaN quantum wells ranging from about 7 to 9%. (Abstract Copyright [2002], Wiley Periodicals, Inc.)

Additional details

Publishing Information

Journal Title
Physica Status Solidi. B, Basic Research
Journal Volume
234
Journal Issue
3
Journal Page Range
p. 742-745
ISSN
0370-1972
CODEN
PSSBBD

Conference

Title
International workshop on nitride semiconductors
Acronym
IWN 2002
Dates
22-25 Jul 2002
Place
Aachen (Germany)

INIS

Country of Publication
Germany
Country of Input or Organization
Germany
INIS RN
34004479
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION SPECTRA; ELECTRODEPOSITED COATINGS; ENERGY SPECTRA; GALLIUM NITRIDES; HETEROJUNCTIONS; INDIUM NITRIDES; TEMPERATURE RANGE 0273-0400 K; ULTRAVIOLET SPECTRA
Descriptors DEC
COATINGS; GALLIUM COMPOUNDS; INDIUM COMPOUNDS; NITRIDES; NITROGEN COMPOUNDS; PNICTIDES; SEMICONDUCTOR JUNCTIONS; SPECTRA; TEMPERATURE RANGE

Optional Information

Notes
With 4 figs., 8 refs.. SICI: 0370-1972(200212)234:3<742::AID-PSSB742>3.0.TX;2-I