Published May 1994
| Version v1
Journal article
Photoelectric relaxation spectroscopy of deep levels in CdS single crystals with the given deviations from stoichiometry in the growth process
Creators
Description
By the photoelectric relaxation spectroscopy method are studied deep level properties in CdS high-purity single crystals, which are distinguished each other in the value of deviations from the stoichiometric composition. Parameters are determlined of the most intensively manifested in spectra traps both for electrons and for holes. Technologic conditions for obtaining the single crystals are revealed
Additional details
Additional titles
- Original title (Russian)
- Фотоэлектрическая релаксационная спектроскопия глубоких уровней в монокристаллах CdS заданными в процессе роста отклонениями от стехиометрии
Publishing Information
- Journal Title
- Fizika i Tekhnika Poluprovodnikov
- Journal Volume
- 28
- Journal Issue
- 5
- Journal Page Range
- p. 721-728.
- ISSN
- 0015-3222
- CODEN
- FTPPA4
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- Russian Federation
- INIS RN
- 26040311
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CADMIUM SULFIDES; CRYSTAL GROWTH; ELECTRIC CONDUCTIVITY; IMPURITIES; MONOCRYSTALS; PARTIAL PRESSURE; SEMICONDUCTOR MATERIALS; STOICHIOMETRY
- Descriptors DEC
- CADMIUM COMPOUNDS; CHALCOGENIDES; CRYSTALS; ELECTRICAL PROPERTIES; MATERIALS; PHYSICAL PROPERTIES; SULFIDES; SULFUR COMPOUNDS; THERMODYNAMIC PROPERTIES