Published December 1995
| Version v1
Journal article
Influence of solar cycle on SPOT-1,-2,-3 upset rates
- 1. CNES, Toulouse (France)
- 2. CERT/ONERA, Toulouse (France)
Description
The French SPOT Earth observation system has now been used for more than eight years. A former study had presented results obtained during the first years of service which took place in solar minimum activity conditions. This paper presents the evolution of the upset rate measured on the 1,088 1-kbit memories of the on-board computer (OBC) throughout minimum and maximum solar activity. Upset rate is well correlated with solar cycle. Little influence of solar flares was observed. Most critical periods are transitions between phases of the solar cycle. Comparison is made with model predictions
Additional details
Publishing Information
- Journal Title
- IEEE Transactions on Nuclear Science
- Journal Volume
- 42
- Journal Issue
- 6Pt1
- Journal Page Range
- p. 1983-1987.
- ISSN
- 0018-9499
- CODEN
- IETNAE
Conference
- Title
- 32. annual IEEE international nuclear and space radiation effects conference.
- Dates
- 17-21 Jul 1995.
- Place
- Madison, WI (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 27045588
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COMPARATIVE EVALUATIONS; CORRELATIONS; IONIZING RADIATIONS; PHYSICAL RADIATION EFFECTS; SATELLITES; SEMICONDUCTOR STORAGE DEVICES; SOLAR CYCLE; SPACE FLIGHT
- Descriptors DEC
- EVALUATION; MEMORY DEVICES; RADIATION EFFECTS; RADIATIONS; SEMICONDUCTOR DEVICES
Optional Information
- Secondary number(s)
- CONF-950716--.