Published August 11, 2008
| Version v1
Journal article
X-ray pulse emission from cesium chloride aqueous solutions when irradiated by double-pulsed femtosecond laser pulses
- 1. Center for Ultrafast Intense Laser Science, Graduate School of Science, University of Tokyo, Tokyo 113-0033 (Japan)
- 2. Department of Chemistry, Graduate School of Science, Tohoku University, Sendai 980-8578 (Japan)
Description
The intensity of x-ray emission from the aqueous solutions irradiated with focused femtosecond laser pulses (main pulses and relatively low-intensity prepulses) was measured as a function of the delay time between the main pulses and prepulses. Four different x-ray intensity peaks were observed in the picosecond and nanosecond ranges. The prepulse irradiation caused an increase in the x-ray intensity by a factor of 103-104, as confirmed by x-ray emission spectroscopy. Time-resolved reflectance measurements and imaging revealed that the increase was caused by the solution surface dynamics such as the picosecond plasma formation and decay and the transient (nanoseconds) surface roughness
Additional details
Identifiers
- DOI
- 10.1063/1.2967882;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 93
- Journal Issue
- 6
- Journal Page Range
- p. 064103-064103.3
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40006781
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- AQUEOUS SOLUTIONS; CESIUM CHLORIDES; EMISSION SPECTRA; EMISSION SPECTROSCOPY; IRRADIATION; LASERS; PULSES; REFLECTIVITY; ROUGHNESS; TIME DELAY; TIME RESOLUTION; X-RAY SPECTRA
- Descriptors DEC
- ALKALI METAL COMPOUNDS; CESIUM COMPOUNDS; CHLORIDES; CHLORINE COMPOUNDS; DISPERSIONS; HALIDES; HALOGEN COMPOUNDS; HOMOGENEOUS MIXTURES; MIXTURES; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RESOLUTION; SOLUTIONS; SPECTRA; SPECTROSCOPY; SURFACE PROPERTIES; TIMING PROPERTIES
Optional Information
- Notes
- (c) 2008 American Institute of Physics