Published September 1, 2019
| Version v1
Journal article
Study the effect of film thickness on the structural and optical of (ZnO) thin film prepared by pulsed laser deposition
- 1. University of Al-Qadisiyah, College of Education Department of Physics (Iraq)
Description
This research included preparation of (ZnO) thin films. On glass substrate using pulsed laser deposition method in room temperature. The structural properties were characterized by X-ray diffraction (XRD). The film grown have a polycrystalline wurtizte structure. It can be seen that the highest texture coefficient was in (101) plane. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/1294/2/022001Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 1294
- Journal Issue
- 2
- Journal Page Range
- [5 p.]
- ISSN
- 1742-6596
Conference
- Title
- 2. International Science Conference
- Dates
- 24-25 Apr 2019
- Place
- Al-Qadisiyah (Iraq)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53045588
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ENERGY BEAM DEPOSITION; GLASS; LASER RADIATION; POLYCRYSTALS; PULSED IRRADIATION; SUBSTRATES; THICKNESS; THIN FILMS; X-RAY DIFFRACTION; ZINC OXIDES
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; CRYSTALS; DEPOSITION; DIFFRACTION; DIMENSIONS; ELECTROMAGNETIC RADIATION; FILMS; IRRADIATION; OXIDES; OXYGEN COMPOUNDS; RADIATIONS; SCATTERING; SURFACE COATING; ZINC COMPOUNDS