Published December 2, 1975
| Version v1
Patent
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Double chamber ion source
Creators
Description
The ion source is comprised of two discharge chambers, one of which is provided with a filament and an aperture leading into the other chamber which in turn has an extraction orifice. A low voltage arc discharge is operated in an inert gas atmosphere in the filament chamber while an arc of higher voltage is operated in the second ionization chamber which contains a vapor which will give the desired dopant ion species. The entire source is immersed in an axial magnetic field parallel to a line connecting the filament, the aperture between the two chambers and the extraction orifice. 3 claims, 2 drawing figures
Availability note (English)
MF available from INIS under the Report Number.Files
8282175.pdf
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Additional details
Additional titles
- Augmented title (English)
- Patent
Publishing Information
- Imprint Pagination
- 6 p.
- IPC:
- Int. Cl.G01T1/20.
- IPC
- Int. Cl.G01T1/20.
- Patent number
- US patent document 3,924,134
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 8282175
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- ELECTRIC DISCHARGES; FILAMENTS; HEAVY IONS; ION IMPLANTATION; ION SOURCES; LIFETIME; PERFORMANCE; RARE GASES
- Descriptors DEC
- CHARGED PARTICLES; ELEMENTS; IONS; NONMETALS