Published April 1990 | Version v1
Journal article

Electron microscopy of YBa2Cu3O7-δ films

  • 1. AN SSSR, Moscow (USSR). Inst. Kristallografii
  • 2. AN SSSR, Gorki (USSR). Inst. Prikladnoj Fiziki

Description

Electron microscopic investigation into YBa2Cu3O7-δ films on (100) SrTiO3, (110) SrTiO3, ZrO2/Si, ZrO2/α-A2O3 substrates produced by laser spraying, technique are conducted. A strong substrat effect on the film structure is detected. In case of SrTiO3 substrate application an epitaxial film growth is observed. The mechanism of orientation of polycrystalline films on Si- and α-Al2O3 substrates with polycrystalline ZrO2 buffer layers consists in anisotropic substrate stresses. ΔTC critical transfer width increase and JC critical current density reduction are linked with a large number of defects in grains, the presence of supplementary phases and defects on intergranular boundaries

Additional details

Additional titles

Original title (Russian)
Электронная микроскопия пленок YBa

Publishing Information

Journal Title
Sverkhprovodimost': Fizika, Khimiya, Tekhnika
Journal Volume
3
Journal Issue
4
Series
Sverkhprovod.: Fiz. Khim. Tekh.
Journal Page Range
658-667