Modeling of high frequency atmospheric pressure Ar/H2/SiH4 glow discharges
Description
In this paper, a one-dimensional self-consistent fluid model is applied to simulate high frequency atmospheric pressure glow discharges. The results show that the plasma density and current density depend strongly on the excitation frequency. When the excitation frequency is below 13.56 MHz, the discharge operates in the α mode, and when the excitation frequency is above 13.56 MHz, the discharge operates in a γ-like mode. The densities of species including SiH3+, SiH3-, SiH3, SiH2, H, Ar+, Ar* and electron are enhanced with the frequency increasing from 6.78 to 27.12 MHz. Similar discharge mode transition was observed experimentally in radio frequency atmospheric pressure He glow discharges. The effects of excitation frequency on plasma characteristics and densities of precursors for μc-Si:H film are further discussed. This study reveals that an appropriate excitation frequency is important for the growth of μc-Si:H film.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2011.01.217Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2011.01.217;
- PII
- S0040-6090(11)00276-8;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 519
- Journal Issue
- 20
- Journal Page Range
- p. 7014-7019
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- 10. Asia-Pacific conference on plasma science and technology; SPSM 2010: 153. symposium on plasma science for materials
- Acronym
- APCPST 2010
- Dates
- 4-8 Jul 2010
- Place
- Jeju Island (Korea, Republic of)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43052039
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ARGON IONS; ATMOSPHERIC PRESSURE; COMPUTERIZED SIMULATION; CURRENT DENSITY; EXCITATION; GLOW DISCHARGES; PLASMA DENSITY; RADIOWAVE RADIATION; SILANES
- Descriptors DEC
- CHARGED PARTICLES; ELECTRIC DISCHARGES; ELECTROMAGNETIC RADIATION; ENERGY-LEVEL TRANSITIONS; HYDRIDES; HYDROGEN COMPOUNDS; IONS; ORGANIC COMPOUNDS; ORGANIC SILICON COMPOUNDS; RADIATIONS; SILICON COMPOUNDS; SIMULATION
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.