Published 2004 | Version v1
Book

Photo electron beam diagnostics at Waseda University

  • 1. Waseda Univ., Advanced Research Institute for Science and Engineering, Tokyo (Japan)

Description

A double slits scan technique for emittance measurements and a frequency analysis technique for bunch length measurements has been developed at Waseda University. Another method for bunch length measurements, RF kicker cavity technique, has been developed. The principle of RF kicker cavity technique is similar to that of streak camera, which converts the time domain of the electron beam to the spatial domain of that. In this paper, we report the experimental results of transverse emittance measurements and bunch length measurements. The transverse emittance as a function of electron beam charge was measured in three cases of laser spot size. The results of bunch length measurements using the frequency analysis technique are in good agreement with simulation results for PARMELA. (author)

Part of:
Proceedings of the 1st annual meeting of Particle Accelerator Society of Japan and the 29th Linear Accelerator Meeting in Japan

Additional details

Publishing Information

Publisher
Particle Accelerator Society of Japan
Imprint Place
Tokyo (Japan)
Imprint Title
Proceedings of the 1st annual meeting of Particle Accelerator Society of Japan and the 29th Linear Accelerator Meeting in Japan
Imprint Pagination
717 p.
Journal Page Range
p. 572-574

Conference

Title
1. annual meeting of Particle Accelerator Society of Japan; 29. Linear Accelerator Meeting in Japan
Dates
4-6 Aug 2004
Place
Funabashi, Chiba (Japan)

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
36037627
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAM BUNCHING; BEAM EMITTANCE; BEAM MONITORING; BEAM MONITORS; ELECTRON BEAMS; ELECTRON GUNS; LASERS; LINEAR ACCELERATORS; MEV RANGE 01-10; PHOTOCATHODES
Descriptors DEC
ACCELERATORS; BEAM DYNAMICS; BEAMS; CATHODES; DYNAMICS; ELECTRODES; ENERGY RANGE; LEPTON BEAMS; MEASURING INSTRUMENTS; MECHANICS; MEV RANGE; MONITORING; MONITORS; PARTICLE BEAMS

Optional Information

Notes
9 refs., 3 figs., 2 tabs.