Photo electron beam diagnostics at Waseda University
Creators
- 1. Waseda Univ., Advanced Research Institute for Science and Engineering, Tokyo (Japan)
Description
A double slits scan technique for emittance measurements and a frequency analysis technique for bunch length measurements has been developed at Waseda University. Another method for bunch length measurements, RF kicker cavity technique, has been developed. The principle of RF kicker cavity technique is similar to that of streak camera, which converts the time domain of the electron beam to the spatial domain of that. In this paper, we report the experimental results of transverse emittance measurements and bunch length measurements. The transverse emittance as a function of electron beam charge was measured in three cases of laser spot size. The results of bunch length measurements using the frequency analysis technique are in good agreement with simulation results for PARMELA. (author)
Additional details
Publishing Information
- Publisher
- Particle Accelerator Society of Japan
- Imprint Place
- Tokyo (Japan)
- Imprint Title
- Proceedings of the 1st annual meeting of Particle Accelerator Society of Japan and the 29th Linear Accelerator Meeting in Japan
- Imprint Pagination
- 717 p.
- Journal Page Range
- p. 572-574
Conference
- Title
- 1. annual meeting of Particle Accelerator Society of Japan; 29. Linear Accelerator Meeting in Japan
- Dates
- 4-6 Aug 2004
- Place
- Funabashi, Chiba (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 36037627
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM BUNCHING; BEAM EMITTANCE; BEAM MONITORING; BEAM MONITORS; ELECTRON BEAMS; ELECTRON GUNS; LASERS; LINEAR ACCELERATORS; MEV RANGE 01-10; PHOTOCATHODES
- Descriptors DEC
- ACCELERATORS; BEAM DYNAMICS; BEAMS; CATHODES; DYNAMICS; ELECTRODES; ENERGY RANGE; LEPTON BEAMS; MEASURING INSTRUMENTS; MECHANICS; MEV RANGE; MONITORING; MONITORS; PARTICLE BEAMS
Optional Information
- Notes
- 9 refs., 3 figs., 2 tabs.