Numerical simulation of the pre-ionization processes during nanosecond-pulse discharge in nitrogen

The pre-ionization of nitrogen gas by high-voltage nanosecond pulse discharges is studied using one-dimensional particle-in-cell numerical simulations. The comparison between the various mechanisms of pre-ionization, i.e., by runaway electrons, x-rays, and ultraviolet radiation, is presented. It is shown that runaway electrons produce a much higher number of electron-ion pairs than those generated by x-rays, which accompany the process of runaway electron generation. Also, results of simulations showed that among photo-ionization mechanisms the most significant gas pre-ionization is caused by x-rays generated in the process of impact ionization of the K-shell of nitrogen atoms.