Soft x-ray tomography on TFTR
Description
The tomographic method used for deriving soft x-ray local emissivities on TFTR, using one horizontal array of 60 soft x-ray detectors, is described. This method, which is based on inversion of Fourier components and subsequent reconstruction, has been applied to the study of a sawtooth crash. A flattening in the soft x-ray profile, which we interpret as an m = 1 island, is clearly visible during the precursor phase and its location and width correlate well with those from electron temperature profiles reconstructed from electron cyclotron emission measurement. The limitations of the Fourier method, due notably to the aperiodic nature of the signals in the fast crash phase and the difficulty of obtaining accurately the higher Fourier harmonics, are discussed. 9 refs., 13 figs
Availability note (English)
MF available from INIS under the Report Number; Available from NTIS, PC A03/MF A01 - OSTI; 1 as DE89006858.Files
20035718.pdf
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Additional details
Publishing Information
- Imprint Pagination
- 35 p.
- Report number
- PPPL--2555
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 20035718
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- COMPUTERIZED SIMULATION; ELECTRON TEMPERATURE; PLASMA DIAGNOSTICS; PLASMA INSTABILITY; SOFT X RADIATION; TEMPERATURE DISTRIBUTION; TFTR TOKAMAK; TOMOGRAPHY
- Descriptors DEC
- CLOSED PLASMA DEVICES; ELECTROMAGNETIC RADIATION; INSTABILITY; IONIZING RADIATIONS; RADIATIONS; SIMULATION; THERMONUCLEAR DEVICES; TOKAMAK DEVICES; X RADIATION
Optional Information
- Notes
- Portions of this document are illegible in microfiche products.