Published October 1980
| Version v1
Journal article
Scanning electron microscope
Creators
Description
The principle underlying the design of the scanning electron microscope (SEM), the design and functioning of SEM are described. Its applications in the areas of microcircuitry and materials science are outlined. The development of SEM in India is reviewed. (M.G.B.)
Additional details
Publishing Information
- Journal Title
- Instrum. Bull.
- Journal Volume
- 1
- Journal Issue
- 1
- Series
- Instrum. Bull.
- Journal Page Range
- 5-6
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 13703701
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ELECTRON SCANNING; INDIA
- Descriptors DEC
- ASIA; DEVELOPING COUNTRIES; MICROSCOPES; MICROSCOPY