Superconductivity in thallium double atomic layer and transition into an insulating phase intermediated by a quantum metal state
Creators
- 1. Department of Physics, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033 (Japan)
- 2. Institute of Automation and Control Processes FEB RAS, 690041 Vladivostok (Russian Federation)
Description
We report on the first observation of superconductivity in a double atomic layer of Tl on Si(1 1 1) using in situ electrical resistivity measurements in ultrahigh vacuum. The structure of the Tl bilayer was characterized by a set of techniques, including scanning tunneling microscopy, electron diffraction and photoemission spectroscopy, which confirmed the metastability and metallic nature of the Tl bilayer. The epitaxial growth of atomically thin 'soft' metallic film over the entire surface of substrate enabled us to find a macroscopic superconducting transition at 0.96 K, accompanied by thermal and quantum fluctuations of order parameter. The system also demonstrates a perpendicular-magnetic-field-induced superconductor-insulator transition, together with an intermediate metallic state. We have found that the magnetoresitivity at the lowest temperature is consistent with the Bose metal picture, which is a consequence of strong quantum fluctuations. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/2053-1583/aa57f9Additional details
Identifiers
Publishing Information
- Journal Title
- 2D Materials
- Journal Volume
- 4
- Journal Issue
- 2
- Journal Page Range
- [10 p.]
- ISSN
- 2053-1583
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50045421
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- LAYERS; MAGNETIC FIELDS; PHOTOELECTRON SPECTROSCOPY; SCANNING TUNNELING MICROSCOPY; SUBSTRATES; SUPERCONDUCTING FILMS; SUPERCONDUCTIVITY; SURFACES; TEMPERATURE RANGE 0000-0013 K; THALLIUM; THIN FILMS
- Descriptors DEC
- ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELECTRON SPECTROSCOPY; ELEMENTS; FILMS; METALS; MICROSCOPY; PHYSICAL PROPERTIES; SPECTROSCOPY; TEMPERATURE RANGE