Published October 1, 2016 | Version v1
Journal article Metadata-only

Simulating nanosecond voltage comparator with improved radiation hardness compatible with PECL logic

Creators

  • 1. National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe shosse 31, 115409 Moscow (Russian Federation)

Description

The typical voltage comparator circuits are considered. Shown that the use of series- parallel connection of cascades improves the accuracy, speed and hardness to single event transient effects. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1757-899X/151/1/012027

Additional details

Identifiers

DOI
10.1088/1757-899X/151/1/012027;

Publishing Information

Journal Title
IOP Conference Series. Materials Science and Engineering (Online)
Journal Volume
151
Journal Issue
1
Journal Page Range
[4 p.]
ISSN
1757-899X

Conference

Title
1. international telecommunication conference on advanced micro- and nanoelectronic systems and technologies
Dates
22-23 Dec 2015
Place
Moscow (Russian Federation)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
49074086
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCURACY; COMPARATOR CIRCUITS; HARDNESS; RADIATION HARDNESS; VELOCITY
Descriptors DEC
ELECTRONIC CIRCUITS; MECHANICAL PROPERTIES