Published November 1, 2005
| Version v1
Journal article
Detection of humidity based on quartz crystal microbalance coated with ZnO nanostructure films
Creators
- 1. Department of Electronic Engineering, East China Normal University, Shanghai 200062 (China) and Department of Computer Science and Technology, Luoyang Technology College, Luoyang 471003 (China)
- 2. Department of Electronic Engineering, East China Normal University, Shanghai 200062 (China)
- 3. State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Wuhan 430070 (China)
Description
The possibilities and properties of ZnO nanorod and nanowire films-coated quartz crystal microbalance (QCM) as a humidity sensor have been investigated. The morphology and crystal structures of ZnO nanorods and nanowires were characterized with X-ray diffraction (XRD) and scanning electron microscopy (SEM). It can be found that the frequency shift of the ZnO nanostructures-coated QCM linearly decreases with increasing relative humidity over the range of 5-97% RH. The experimental results demonstrated that ZnO nanostructures-coated QCM are usable as a humidity sensor and as an analytical device. It appears that the ZnO nanomaterial films can be used as efficient humidity sensors
Additional details
Identifiers
- DOI
- 10.1016/j.physb.2005.07.001;
- PII
- S0921-4526(05)00875-6;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 368
- Journal Issue
- 1-4
- Journal Page Range
- p. 94-99
- ISSN
- 0921-4526
- CODEN
- PHYBE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37068338
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CRYSTAL STRUCTURE; CRYSTALS; DETECTION; FILMS; HUMIDITY; MICROBALANCES; MORPHOLOGY; QUANTUM WIRES; QUARTZ; SCANNING ELECTRON MICROSCOPY; X-RAY DIFFRACTION; ZINC OXIDES
- Descriptors DEC
- BALANCES; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; MEASURING INSTRUMENTS; MICROSCOPY; MINERALS; MOISTURE; NANOSTRUCTURES; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; SCATTERING; WEIGHT INDICATORS; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.