Published March 1991
| Version v1
Journal article
Minimum data set requirements for ion microtomography
- 1. Sandia National Labs., Livermore, CA (USA)
- 2. Lawrence Livermore National Lab., Livermore, CA (USA)
Description
Data acquisition and analysis rates and data set size seriously affect the practicality of conducting ion microtomography studies that map out material densities of extended objects in three dimensions. For the promise of today's fine spatial resolution capabilities to be met, huge data sets must be acquired, processed, and analyzed efficiently. In this paper, we present the results of an experimental parametric study exploring the limits of minimizing the amount of data required for tomographic reconstruction. We consider data acquisition system resolution and the effect of limited accuracy of stopping powers. We show graphically the specific results of variation of parameters affecting minimum data set size. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research, Section B
- Journal Volume
- 54
- Journal Issue
- 1-3
- Series
- Nucl. Instrum. Methods Phys. Res., Sect. B.
- Journal Page Range
- 383-389
- ISSN
- 0168-583X
- CODEN
- NIMBE
Conference
- Title
- 2. international conference on nuclear microprobe technology and applications.
- Dates
- 5-9 Feb 1990.
- Place
- Melbourne (Australia).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 22077811
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCURACY; COMPUTERIZED TOMOGRAPHY; DATA ACQUISITION; DENSITY; HYDROGEN IONS 1 PLUS; IMAGE PROCESSING; ION MICROSCOPY; PROTON MICROPROBE ANALYSIS; SPATIAL RESOLUTION; STOPPING POWER; TRANSMISSION
- Descriptors DEC
- CATIONS; CHARGED PARTICLES; CHEMICAL ANALYSIS; HYDROGEN IONS; IONS; MICROANALYSIS; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; PHYSICAL PROPERTIES; RESOLUTION; TOMOGRAPHY