Published 1996
| Version v1
Miscellaneous
Parameterizing microstructure from small-angle X-ray scattering data
Creators
- 1. National Inst. of Standards and Technology, Gaithersburg, MD (United States). Polymer Structure and Mechanics Group
Description
Short communication
Additional details
Publishing Information
- Imprint Title
- Proceedings of the 10. International conference on small-angle scattering; Workshop on synchrotron radiation and neutron SAS: instrumentation and industrial applications. Abstracts
- Imprint Pagination
- 295 p.
- Journal Page Range
- p. 104.
Conference
- Title
- instrumentation and industrial applications.
- Acronym
- 10. International conference on small-angle scattering; Workshop on synchrotron radiation and neutron SAS
- Dates
- 21-26 Jul 1996.
- Place
- Campinas, SP (Brazil).
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 28040140
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, No Abstract, Non-conventional Literature
- Descriptors DEI
- CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; CRYSTALS; DIFFRACTION; MICROSTRUCTURE; SCATTERING; SMALL ANGLE SCATTERING; STRUCTURAL CHEMICAL ANALYSIS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING
Optional Information
- Notes
- Imprint:The proceedings of the 10. International conference on small-angle scattering will be published by the Journal of Applied Crystallography.