Magnetic phase diagram of Fe0.82Ni0.18/V(0 0 1) superlattices
Description
Fe0.82Ni0.18/V(0 0 1) superlattices grown by DC magnetron sputtering on MgO(0 0 1) substrates have been investigated using longitudinal MOKE, SQUID magnetometry and magnetoresistance measurements. The varying sign and strength of the interlayer exchange coupling (IEC) were identified in the thin layer region (0.4-2.4 nm) and a magnetic IEC phase diagram was deduced and analyzed in terms of density functional calculations. The maximum giant magnetoresistance effect was determined to be 2.5% at 21 K. The balance between the magnetic anisotropy and IEC was found to be significantly different from that of previously studied Fe/V superlattices, also causing a different dependence of both IEC strength and observed anisotropy on the magnetic layer thickness
Additional details
Identifiers
- DOI
- 10.1016/j.jmmm.2004.03.033;
- PII
- S0304885304002975;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 280
- Journal Issue
- 2-3
- Journal Page Range
- p. 346-357
- ISSN
- 0304-8853
- CODEN
- JMMMDC
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36059302
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANISOTROPY; COUPLING; DENSITY FUNCTIONAL METHOD; IRON; IRON COMPOUNDS; LAYERS; MAGNESIUM OXIDES; MAGNETORESISTANCE; MAGNETRONS; NICKEL COMPOUNDS; PHASE DIAGRAMS; SPUTTERING; SQUID DEVICES; SUPERLATTICES; THICKNESS; VANADIUM
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; CALCULATION METHODS; CHALCOGENIDES; DIAGRAMS; DIMENSIONS; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FLUXMETERS; INFORMATION; MAGNESIUM COMPOUNDS; MEASURING INSTRUMENTS; METALS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SUPERCONDUCTING DEVICES; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS; VARIATIONAL METHODS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.