Error in surface resistance originating from the dielectric loss of the parallel-plate dielectric resonator using the two-resonators method
Creators
Description
An error in surface resistance (Rs) originating from the dielectric loss (tanδ) of the parallel plate dielectric resonator using the two-resonators method is investigated. In the two-resonators method, the error in Rs(ΔRs) due to the difference in tanδ(Δtanδ) between the TE011 and TE01n mode rods is examined, considering the actual scattering of values of tanδ among sapphire rods. Taking this scattering into account, the projected value of ΔRs cannot be disregarded for general Rs values (about 0.1 mΩ) of HTS films. As a comparative simulation, the case of a single resonator was also considered where the tanδ is neglected in the estimate of Rs. Due to the uncertainty and complexity in the two-resonators method, this method is not so superior to the single-rod resonator measurement by neglecting tanδ at higher resonance frequency
Additional details
Identifiers
- DOI
- 10.1016/j.physc.2004.01.148;
- PII
- S0921453404008962;
Publishing Information
- Journal Title
- Physica. C, Superconductivity
- Journal Volume
- 412-414
- Journal Issue
- 1-2
- Journal Page Range
- p. 1524-1527
- ISSN
- 0921-4534
- CODEN
- PHYCE6
Conference
- Title
- 16. International symposium on superconductivity: Advances in superconductivity XVI. Part I
- Acronym
- ISS 2003
- Dates
- 27-29 Oct 2003
- Place
- Tsukuba (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36062094
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COMPUTERIZED SIMULATION; DIELECTRIC MATERIALS; ERRORS; HIGH-TC SUPERCONDUCTORS; PLATES; RELAXATION LOSSES; RESONANCE; RESONATORS; RODS; SAPPHIRE; SCATTERING; SUPERCONDUCTING FILMS; SURFACES
- Descriptors DEC
- CORUNDUM; ELECTRONIC EQUIPMENT; ENERGY LOSSES; EQUIPMENT; FILMS; LOSSES; MATERIALS; MINERALS; OXIDE MINERALS; SIMULATION; SUPERCONDUCTORS; TYPE-II SUPERCONDUCTORS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.