Published October 2004 | Version v1
Journal article

Error in surface resistance originating from the dielectric loss of the parallel-plate dielectric resonator using the two-resonators method

Description

An error in surface resistance (Rs) originating from the dielectric loss (tanδ) of the parallel plate dielectric resonator using the two-resonators method is investigated. In the two-resonators method, the error in Rs(ΔRs) due to the difference in tanδ(Δtanδ) between the TE011 and TE01n mode rods is examined, considering the actual scattering of values of tanδ among sapphire rods. Taking this scattering into account, the projected value of ΔRs cannot be disregarded for general Rs values (about 0.1 mΩ) of HTS films. As a comparative simulation, the case of a single resonator was also considered where the tanδ is neglected in the estimate of Rs. Due to the uncertainty and complexity in the two-resonators method, this method is not so superior to the single-rod resonator measurement by neglecting tanδ at higher resonance frequency

Additional details

Identifiers

DOI
10.1016/j.physc.2004.01.148;
PII
S0921453404008962;

Publishing Information

Journal Title
Physica. C, Superconductivity
Journal Volume
412-414
Journal Issue
1-2
Journal Page Range
p. 1524-1527
ISSN
0921-4534
CODEN
PHYCE6

Conference

Title
16. International symposium on superconductivity: Advances in superconductivity XVI. Part I
Acronym
ISS 2003
Dates
27-29 Oct 2003
Place
Tsukuba (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36062094
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COMPUTERIZED SIMULATION; DIELECTRIC MATERIALS; ERRORS; HIGH-TC SUPERCONDUCTORS; PLATES; RELAXATION LOSSES; RESONANCE; RESONATORS; RODS; SAPPHIRE; SCATTERING; SUPERCONDUCTING FILMS; SURFACES
Descriptors DEC
CORUNDUM; ELECTRONIC EQUIPMENT; ENERGY LOSSES; EQUIPMENT; FILMS; LOSSES; MATERIALS; MINERALS; OXIDE MINERALS; SIMULATION; SUPERCONDUCTORS; TYPE-II SUPERCONDUCTORS

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.