Published 1996 | Version v1
Book

Simulation of charge cloud evolution in silicon drift detectors

Description

The spread of the signal during the drift period before collection is a critical parameter for silicon drift detector operation. In this work, simulations have been used to gain an understanding of the charge cloud evolution. Diffusion, coulomb repulsion within the charge cloud, and variations in the drift field were all found to influence the signal spread. Fluctuations in dopant concentration were found to dramatically influence the drift field

Additional details

Publishing Information

Publisher
IEEE Service Center.
Imprint Place
Piscataway, NJ (United States)
Imprint Title
1996 IEEE nuclear science symposium - conference record. Volumes 1, 2 and 3
Imprint Pagination
2138 p.
Journal Page Range
p. 558-562.

Conference

Title
Institute of Electrical and Electronic Engineers (IEEE) nuclear science symposium and medical imaging conference.
Dates
2-9 Nov 1996.
Place
Anaheim, CA (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
28068909
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CHARGE DISTRIBUTION; MONTE CARLO METHOD; SI SEMICONDUCTOR DETECTORS; SIMULATION
Descriptors DEC
CALCULATION METHODS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS

Optional Information

Secondary number(s)
CONF-961123--.