Published 1996
| Version v1
Book
Simulation of charge cloud evolution in silicon drift detectors
Creators
Description
The spread of the signal during the drift period before collection is a critical parameter for silicon drift detector operation. In this work, simulations have been used to gain an understanding of the charge cloud evolution. Diffusion, coulomb repulsion within the charge cloud, and variations in the drift field were all found to influence the signal spread. Fluctuations in dopant concentration were found to dramatically influence the drift field
Additional details
Publishing Information
- Publisher
- IEEE Service Center.
- Imprint Place
- Piscataway, NJ (United States)
- Imprint Title
- 1996 IEEE nuclear science symposium - conference record. Volumes 1, 2 and 3
- Imprint Pagination
- 2138 p.
- Journal Page Range
- p. 558-562.
Conference
- Title
- Institute of Electrical and Electronic Engineers (IEEE) nuclear science symposium and medical imaging conference.
- Dates
- 2-9 Nov 1996.
- Place
- Anaheim, CA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 28068909
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGE DISTRIBUTION; MONTE CARLO METHOD; SI SEMICONDUCTOR DETECTORS; SIMULATION
- Descriptors DEC
- CALCULATION METHODS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS
Optional Information
- Secondary number(s)
- CONF-961123--.