Commissioning and first results of scanning type EXAFS beamline (BL-09) at INDUS-2 synchrotron source
Creators
- 1. Atomic and Molecular Physics Division, Bhabha Atomic Research Centre, Mumbai -400085 (India)
- 2. Indus Synchrotrons Utilization Division, Raja Ramanna Centre for Advanced Technology, Indore- 452013 (India)
Description
An Energy Scanning X-ray Absorption Fine Structure spectroscopy beamline has recently been installed and commissioned at BL-09 bending magnet port of INDUS-2 synchrotron source, Indore. The beamline uses an UHV compatible fixed exit double crystal monochromator (DCM) with two Si (111) crystals. Two grazing incidence cylindrical mirrors are also used in this beamline; the pre-mirror is used as a collimating mirror while the post mirror is used for vertical focusing and higher harmonic rejection. In this beamline it is possible to carry out EXAFS measurements both in transmission and fluorescence mode on various types of samples, using Ionization chamber detectors and solid state drift detector respectively. In this paper, results from first experiments of the Energy Scanning EXAFS beamline are presented
Additional details
Identifiers
- DOI
- 10.1063/1.4872706;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1591
- Journal Issue
- 1
- Journal Page Range
- p. 649-651
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 58. DAE solid state physics symposium 2013
- Dates
- 17-21 Dec 2013
- Place
- Patiala, Punjab (India)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45090764
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S43: PARTICLE ACCELERATORS; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; BEAM BENDING MAGNETS; BEAM TRANSPORT; COMMISSIONING; FINE STRUCTURE; FLUORESCENCE; INDUS-2; IONIZATION CHAMBERS; MIRRORS; MONOCHROMATORS; SILICON; X-RAY SPECTROSCOPY
- Descriptors DEC
- ELEMENTS; EMISSION; EQUIPMENT; LUMINESCENCE; MAGNETS; MEASURING INSTRUMENTS; PHOTON EMISSION; RADIATION DETECTORS; RADIATION SOURCES; SEMIMETALS; SPECTROSCOPY; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES
Optional Information
- Notes
- (c) 2014 AIP Publishing LLC