Published November 15, 2006 | Version v1
Journal article

Investigation of reference samples for residual strain measurements in a welded specimen by neutron and synchrotron X-ray diffraction

  • 1. Mechanical Engineering Department, Monash University, Vic. 3800 (Australia)
  • 2. School of Physics, Monash University, Vic. 3800 (Australia)
  • 3. FaME38 at the ESRF-ILL (France)
  • 4. Materials and Engineering Sciences, ANSTO, Lucas Heights, NSW 2234 (Australia)

Description

In this research, both neutron and synchrotron X-ray diffraction techniques have been used to investigate variations in measured d spacing in two reference samples. The reference 'stress-free' samples, a set of cubes and a comb sample, were produced using electro-discharge machining (EDM) to obtain a macro-strain-relieved condition. It is shown that there is a variation in microstructure across the parent metal, heat-affected zone (HAZ) and weld metal. A study of the issues in using the cubes and comb sample to provide reference d 0 values for the measurement of residual stress in welding is presented

Additional details

Identifiers

DOI
10.1016/j.physb.2006.05.245;
PII
S0921-4526(06)01098-2;

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
385-386
Journal Page Range
p. 904-907
ISSN
0921-4526
CODEN
PHYBE3

Conference

Title
8. international conference on neutron scattering
Dates
27 Nov - 2 Dec 2005
Place
Sydney (Australia)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38070843
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
HEAT AFFECTED ZONE; MACHINING; METALS; MICROSTRUCTURE; NEUTRON DIFFRACTION; RESIDUAL STRESSES; STRAINS; STRUCTURAL CHEMICAL ANALYSIS; VARIATIONS; WELDED JOINTS; WELDING; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; ELEMENTS; FABRICATION; JOINING; JOINTS; SCATTERING; STRESSES; ZONES

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.