Published April 1, 2016
| Version v1
Journal article
Effect of biaxial strain and external electric field on electronic properties of MoS2 monolayer: A first-principle study
Creators
- 1. School of Mechanical Engineering, Le Quy Don Technical University, Ha Noi (Viet Nam)
- 2. Institute of Research and Development, Duy Tan University, Da Nang (Viet Nam)
Description
In this work, making use of density functional theory (DFT) computations, we systematically investigate the effect of biaxial strain engineering and external electric field applied perpendicular to the layers on the band gaps and electronic properties of monolayer MoS2. The direct-to-indirect band gaps and semiconductor-to-metal transition are observed in monolayer MoS2 when strain and electric field are applied in our calculation. We show that when the biaxial strain and external electric field are introduced, the electronic properties including band gaps of monolayer MoS2 can be reduced to zero. Our results provide many useful insights for the wide applications of monolayer MoS2 in electronics and optoelectronics.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.chemphys.2016.01.009Additional details
Identifiers
- DOI
- 10.1016/j.chemphys.2016.01.009;
- PII
- S0301-0104(15)30202-0;
Publishing Information
- Journal Title
- Chemical Physics
- Journal Volume
- 468
- Journal Page Range
- p. 9-14
- ISSN
- 0301-0104
- CODEN
- CMPHC2
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48092793
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- DENSITY FUNCTIONAL METHOD; DISPERSIONS; ELECTRIC FIELDS; LAYERS; MOLYBDENUM; MOLYBDENUM SULFIDES; SEMICONDUCTOR MATERIALS; SILICON OXIDES; STRAINS
- Descriptors DEC
- CALCULATION METHODS; CHALCOGENIDES; ELEMENTS; MATERIALS; METALS; MOLYBDENUM COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; REFRACTORY METAL COMPOUNDS; REFRACTORY METALS; SILICON COMPOUNDS; SULFIDES; SULFUR COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS; VARIATIONAL METHODS
Optional Information
- Copyright
- Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.