Published January 11, 2008
| Version v1
Journal article
EASYREF: Energy analysis system for reflectometers
Creators
- 1. Laboratoire Leon Brillouin CEA/CNRS UM12, Centre d'Etudes de Saclay, 91191 Gif sur Yvette Cedex (France)
Description
We present a compact device, which can perform the energy analysis of a white neutron beam with an energy resolution of 5-10% for wavelengths λ ranging between 0.2 and 2.5 nm. We propose that such a device could be used on neutron reflectometers in order to get rid of the disk chopper or the monochromator. Gains in flux of 1 to 2 orders of magnitude can be foreseen for specular reflectivity measurements
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2007.10.042Additional details
Identifiers
- DOI
- 10.1016/j.nima.2007.10.042;
- PII
- S0168-9002(07)02224-3;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 584
- Journal Issue
- 2-3
- Journal Page Range
- p. 401-405
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39066168
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ENERGY ANALYSIS; ENERGY RESOLUTION; EQUIPMENT; GAIN; MONOCHROMATORS; NEUTRON BEAMS; NEUTRONS; OPTICS; REFLECTIVITY; SPECTROSCOPY; WAVELENGTHS
- Descriptors DEC
- AMPLIFICATION; BARYONS; BEAMS; ELEMENTARY PARTICLES; FERMIONS; HADRONS; NUCLEON BEAMS; NUCLEONS; OPTICAL PROPERTIES; PARTICLE BEAMS; PHYSICAL PROPERTIES; RESOLUTION; SURFACE PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.