Nuclear analytical techniques and applications to materials processing

This paper will present the application of Rutherford backscattering spectrometry to thin film steochiometry determination and application to optimization of the film process elaboration in the case of dielectric films (Ge,Pb,O) and ionic conductors films (Na,Al,O). After we shall present the application of particles induced gamma emission (PIGE) for the characterization of ternary compounds (B,Si,C) used as coating to protect composites materials. The last part of this paper will describe the determination of oxygen in the bulk of fluoride glasses with charged particles activation analysis. (orig.)